A bent, multi-wall nanotube on silicon dioxide.
May 11, 2010
A bent, multi-wall nanotube on silicon dioxide. The tube is draped across a gold electrode (see insert), and was scanned using conductance imaging AFM, a method that combines force microscopy and contact resistance measurements. The colors represent conductance data and the height gives topographical data. As the tube bends it forms buckles. The buckles have a different contact area to the tip than the rest of the tube and thus show up very nicely in the conductance data.