Jordan Valley Named Among 2011 50 Fastest Growing Companies in Israel by Deloitte Technology Fast 50
MIGDAL HA’EMEK, Israel, October 4, 2011 /PRNewswire/ –
Jordan Valley Semiconductors Ltd. (JVS), a leading provider of X-ray
metrology solutions for the global semiconductors industry, announced today
it has been named one of the 2011 Deloitte Israel Technology Fast 50, the
ranking of the 50 fastest growing technology companies in Israel. Rankings
are based on percentage of fiscal year revenue growth over five years.
“Since the Deloitte Brightman Almagor Zohar Fast 50 award measures
sustained revenue growth over five years, being one of the 50 fastest
growing technology companies in Israel is an impressive achievement”, said
Tal Chen, partner in charge of the Deloitte Brightman Almagor Zohar Israel
Technology Fast 50 Program. “Jordan Valley deserves a lot of credit for its
“Jordan Valley is extremely proud to be named to the Fast 50 list, for
the 4th time in the last 6 years” says Isaac Mazor, Jordan Valley founder
and CEO. “Our growth is a testament to our entire organization’s commitment
to technological superiority and to the wide adaptation of our x-ray
metrology into the advanced semiconductor manufacturing processes as well as
other emerging markets such as the LED and compound semiconductors.”
About the JVX6200i[TM]semiconductors production metrology tool
The JVX6200i(TM) advanced X-ray metrology system is a high throughput,
high uptime and low Cost of ownership production tool. It is a multi-channel
metrology tool for advanced semiconductors FEOL and BEOL processes as well
as wafer-level packaging (WLP) applications. The popular configuration
combines X-ray fluorescence (XRF) and X-ray reflectance (XRR). Typical
applications are: FEOL (High-k/metal gate, SiON and ACL hard masks), BEOL
(Cu seed/barrier, Cu electroplating & CMP) and WLP (UBM stack, Sn/Ag micro
bumps and Cu pillars).
About the JVX7200[TM]semiconductors production metrology tool
The JVX7200 (TM) advanced X-ray metrology system is the first in-line
production control tool for epitaxial SiGe &Si:C applications. This tool
combines Fast HRXRD and Fast XRR channels, capable of measuring SiGe
composition, thickness, density, strain and relaxation of single and
multi-layer stacks on product wafers with high throughput, accuracy and
repeatability. Unlike optical or spectroscopic tools HRXRD and XRR are first
principle techniques that deliver accurate and precise results without
About QC3(TM) / QC-Velox(TM) LED & compound semi production metrology
The QC3 / QC-Velox are High Resolution X-Ray Diffractometers (HRXRD)
especially designed for production in-line quality control for the compound
Semi markets such as LED, Photovoltaic, CPV, Power Transistors, RF and
The tools are designed for epitaxial thin-film materials analysis,
measuring thickness, composition and relaxation of epilayers such as GaN,
GaAs, InP, MQW, Si, Ge & others. QC-Velox demonstrates the best
cost-performance ratio with outstanding throughput, competitive price and
low cost of ownership
About Jordan Valley Semiconductors Ltd. http://www.jvsemi.com
Jordan Valley Semiconductors (JVS), the leader in X-ray metrology
solutions for the semiconductor industry, develops manufactures and sells
fully automated metrology tools for advanced technology nodes based on
non-contacting and non-destructive tools.
The company offers the semiconductor industry the most comprehensive
portfolio of advanced metrology tools, based on technologies such as XRR,
XRF, WAXRD, SAXS, HRXRD and VUV.
Jordan Valley’s investors include Clal Industries and Investments Ltd.
(TASE: CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries
Ltd. (TASE: ELRN).With headquarters in Migdal Haemek Israel, the company has
subsidiaries in Durham United Kingdom, Austin Texas USA, Hsin-Chu Taiwan, as
well as offices and representatives worldwide.
For more information:
Alon Kapel, Director of Sales & Marketing, Jordan Valley Semiconductors Ltd.
Tel: +972-4-654-3666 x 134 email@example.com
SOURCE Jordan Valley Semiconductors Ltd.