Last updated on April 19, 2014 at 8:29 EDT

LeCroy Showcases Signal Integrity Product Innovations and Technology Expertise at DesignCon 2012

January 31, 2012

CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif., Jan. 31, 2012 /PRNewswire/ — LeCroy Corporation, a Diamond Sponsor of the DesignCon 2012 exposition, will premiere an array of innovative new products and technologies, demonstrating continued leadership in the speed, performance and analysis capabilities of oscilloscopes and signal integrity test solutions. In addition, LeCroy experts will present seven technical presentations and participate in two industry panels focusing on innovative approaches to solving some of the most significant test and measurement challenges facing signal integrity engineers today. LeCroy engineers will also be available for discussion on the exhibition floor at LeCroy Booth 101.

Product demonstrations include: (1) LabMaster 9 Zi-A modular oscilloscope with up to 20 channels, 120 GS/s, and 45 GHz previewing LeCroy’s new multi-lane serial data analysis platform with crosstalk analysis and virtual probing; (2) WaveMaster 8 Zi-A, the award-winning 45 GHz, 120 GS/s oscilloscope; (3) LabMaster 10 Zi preview, world’s highest bandwidth– up to 60 GHz–and highest channel density oscilloscope; (4) SPARQ,12-port, 30 GHz signal integrity network analyzers; (5) HRO 66Zi, the industry’s first 12-bit high resolution oscilloscope; (6) Kibra, the industry’s first standalone DDR4 bus and timing analyzer; (7) the most comprehensive end-to-end test instrument suites featuring the PeRT3, the industry’s only protocol-enabled receiver tester, for USB3, SATA, PCI Express®, and many other protocols.

Innovative Product Demonstrations

LeCroy has unveiled a new record-breaking high-bandwidth oscilloscope at DesignCon for each of the past three years. This year attendees will again have the opportunity to discuss with LeCroy engineers the capabilities and supporting technologies of the latest bandwidth breakthrough. The LabMaster 10 Zi incorporates the industry’s most advanced 8HP SiGe 36 GHz chipset combined with LeCroy’s patented Digital Bandwidth Interleave (DBI) technology and LabMaster Zi ChannelSync architecture to deliver 60 GHz of bandwidth, nearly double the real-time bandwidth of competitive manufacturers. The LabMaster 10 Zi also delivers unparalleled performance in “bandwidth density,” which refers to the number of fully synchronized high-bandwidth channels available to the user. The LabMaster 10 Zi provides ten times the bandwidth density of competitive solutions with up to twenty channels at 36 GHz and up to ten channels at 60 GHz.

The WaveMaster 8 Zi-A oscilloscope, the winner of the annual DesignVision Award presented by UBM Electronics in the Test and Measurement Equipment category for the past two years, will be part of LeCroy’s end-to-end serial data analysis demonstrations for PCI Express(®) and Serial Data Analysis. The LeCroy PCI Express(®) 3.0 lineup also includes the PeRT3 Phoenix Protocol-enabled Receiver and Transmitter Tolerance Tester, and a new multi-lead probe for the Summit(TM) T3-16 and Summit T3-8 Protocol Analyzers.

LeCroy is the only oscilloscope manufacturer to offer 12-bit high resolution oscilloscopes with up to 600 MHz bandwidth. The world’s clearest and lowest-noise oscilloscopes, LeCroy’s HROs combine true 12-bit ADC’s and newly designed low-noise front ends to deliver unmatched signal fidelity. From the crisp, ultra-thin traces to the blazing update speed and responsiveness, LeCroy HRO models provide a shocking contrast to traditional 8-bit oscilloscopes.

LeCroy has also announced the new Kibra 480 platform which features proprietary probing technology designed to non-intrusively monitor DDR4′s higher transfer speeds without time consuming signal calibration and setup.

The SPARQ signal integrity network analyzer makes S-parameter measurements quickly and is a fraction of the price of a Vector Network Analyzer (VNA). With the recently launched 8 and 12-port SPARQ models, signal integrity engineers finally have the product they need to quickly characterize crosstalk in multi-lane differential structures.

Also previewed will be a new multi-lane serial data analysis platform which enables users to analyze and compare up to four lanes simultaneously, rapidly measuring eye diagrams and performing jitter and crosstalk analysis. The platform also seamlessly integrates the forthcoming VirtualProbe and Crosstalk Analysis packages. The VirtualProbe software can de-embed fixtures and include the effects of virtual structures by incorporating S-parameter models. The innovative Crosstalk package allows users to gain insight into the crosstalk that interferes with serial data transmissions. The package determines the vertical noise due to crosstalk, returning measurements of the total, deterministic and random noise due to aggressor lanes, and provides a variety of analysis tools to debug the source of crosstalk.

Expert Technical Presentations

Topics covered in technical papers presented by LeCroy engineers are: (1) de-embedding in high speed design; (2) 12 Gbps interoperability for high-loss and crosstalk-aggressed channels; (3) simulating high speed serial link performance; (4) discrete frequency S-parameters and continuous frequency responses; and (5) algorithms for enforcing reciprocity, passivity and causality in S-parameters.

Two sessions led by signal integrity expert Eric Bogatin will cover (6) how return loss gets its ripples and an (7) industry forum answering today’s most pressing signal integrity questions.

Finally, LeCroy will participate in two compelling industry panels. Closing the conference on Wednesday will be, (8) “Delivering on Time-to-Answer: Meeting Designers Needs in Test & Measurement”, a moderated industry panel discussion about the nature of test, the interactions and issues designers face, and how test technology is evolving to meet designers’ needs. Panelists include: Dave Graef, Vice President and Chief Technology Officer, LeCroy Corporation; Kevin Ilcisin, CTO, Tektronix; Greg Peters, GM and VP of Component Test Division, Agilent; and Eric Starkloff, Vice President of Systems Platforms at National Instruments. Experts from LeCroy, Tektronix, Agilent, Teraspeed Consulting, Altera, and LSI Corp. comprise the panel delivering (9) “The Case of the Closing Eye: De-Mystifying the Measurement Complexity”.

About LeCroy

LeCroy Corporation is a worldwide leader in signal integrity test solutions, creating advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals. The Company offers high-performance oscilloscopes, serial data analyzers, and global communications protocol test solutions used by design engineers in the computer and semiconductor, data storage device, automotive and industrial, and military and aerospace markets. LeCroy’s 48-year heritage of technical innovation is the foundation for its recognized leadership in “WaveShape Analysis”–capturing, viewing, and measuring the high-speed signals that drive today’s information and communications technologies. LeCroy is headquartered in Chestnut Ridge, New York. Company information is available at www.lecroy.com.

© 2012 by LeCroy Corporation. All rights reserved. Specifications are subject to change without notice.

Media contact: Patrick Brightman – SGW (973) 263-5475
LeCroy Contact: Ken Johnson, Director of Marketing (845) 425-2000
Customer contact: LeCroy Customer Care Center (800) 553-2769
Website: www.lecroy.com

SOURCE LeCroy Corporation

Source: PR Newswire