McBain’s New Benchtop Infrared Inspection System Provides Smaller Footprint, Lower Cost
SIMI VALLEY, Calif., March 19, 2012 /PRNewswire/ — McBain Systems, a provider of microscopes and inspection equipment for nearly fifty years, has introduced a new, more affordable system for interior, infrared (IR) inspection – for semiconductor and other advanced technology industries. The new BT-IR Benchtop Infrared Microscope System allows an operator to see through materials that are transparent in the infrared range between 740nm and 1700nm.
Despite its lower price point, the new BT-IR provides exceptional performance and precision. Initial experiments indicate that it is able to penetrate thicker, more highly doped materials with rougher surfaces than other systems – and deliver higher quality images. The BT-IR yields submicron-precision optical measurements, and its staging provides up to 0.1 micron linear encoder resolution. In addition, the system is reputed to have the highest resolution 900-1700 InGaAs digital camera in its class.
“The new BT-IR System fills an important market niche,” said Michael Crump, President and CEO of McBain Systems. “It is a manual system with a smaller footprint and lower price, yet it is designed to provide much of the power and flexibility of our higher end inspection systems. And users can start with the BT-IR and later scale up to one of our larger, more automated IR inspection systems, such as the DDR-300NIR or DDR-2000SWIR, as their needs grow.”
The McBain BT-IR system features a motorized XY stage with joystick controls to navigate, observe and measure bonded wafer/die alignments, find defects in a manual mode and determine material stress via the system’s optional birefringence capability. The system is well suited for imaging, verification, inspection and metrology for a range of QA/Reliability and R&D applications. Typical in-process applications include verification of pre-bond and pre-hybridization for critical-alignment applications. Post-process uses include validation, inspection, and measurement of critical sub-surface features in NIR/SWIR-transmissible materials. And failure analysis applications include tool verification, part characterization, qualification and environmental testing. More information and literature on the BT-IR Inspection System are available on the McBain website at http://www.mcbainsystems.com/McBainInfraredInspection_benchtop.php
McBain designs and manufactures integrated optical-mechanical systems that address special inspection, analysis and metrology applications in many advanced-technology industries, from semiconductor to solar, medical device manufacturing to aerospace. These systems are sold and supported worldwide. In addition to marketing its own McBain-branded systems, McBain is also the country’s largest exclusive regional dealer for Leica microscopes for industrial applications across the Southwest and South Central U.S., extending from Southern California through Louisiana. http://www.mcbainsystems.com/contact.php
McBain (http://www.mcbainsystems.com/) is a privately held company, founded in 1965. Formerly known as McBain Instruments, it was based in Chatsworth, CA. In 2008, the company relocated its headquarters to Simi Valley and changed its name to McBain Systems to more accurately reflect its current charter and scope, which includes the engineering, manufacturing, sales and service of complete integrated systems. McBain also maintains regional offices in Chandler, AZ, and Irving, TX.
SOURCE McBain Systems