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Jordan Valley Semiconductors Wins More Market Share in Advanced Wafer Level Packaging

July 3, 2014

MIGDAL HAEMEK, Israel, July 3, 2014 /PRNewswire/ –

Jordan Valley Semiconductors Ltd. [http://www.jordanvalley.com
[https://webmail.jvsemi.com/exchweb/bin/redir.asp?URL=http://www.jordanvalley.com ]], a
leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing
lines, today announced that its micro-spot X-ray Fluorescence (microXRF) metrology tool
has been qualified for production monitoring of advanced Wafer Level Packaging (WLP)
processes, by another leading memory player. The tool provides fully automated metrology
solutions for several key applications, including single micro-bump chemical composition
and height measurements, as well as control of multi-layer Under Bump Metallization (UBM)
stack deposition.

Isaac Mazor, Jordan Valley’s CEO, said: “We are glad to add another leading memory
customer to our distinguished list of advanced customers. This is additional proof that
Jordan Valley’s tool and technology superiority is well appreciated and serves leading
companies in the industry. Advancements in WLP technologies, such as the scaling down of
solder bumps, complex UBM stacks, etc., set new metrology challenges and requirements that
Jordan Valley can address. We believe that our tools will further contribute to our
customer’s high yield targets in the current and future WLP process.”

Jordan Valley’s micro-XRF metrology tool is the “tool of record” for single bump
composition measurements. It is ideal for non-destructive, in-line micro-bump %Ag
measurements and uses a vertical excitation geometry that provides the smallest beam
footprint with no dependence on height variation. The tool provides information critical
for WLP process control, and comes with fully automated recipe driven measurements and
analysis capabilities, advanced navigation algorithms for measurement on product wafers
and more.

Jordan Valley’s management will attend Semicon West 2014 in San Francisco on July
7-10, 2014.

About the company:

Jordan Valley is a market leader in X-ray metrology and non-visual defect detection
tools for the semiconductor industry.

Jordan Valley’s tools are fully automated non-contacting and non-destructive tools,
designed for production control on patterned or blanket wafers. Jordan Valley offers a
comprehensive portfolio of advanced metrology and defect detection tools, based on X-ray
technologies such as XRR (X-ray reflectomerty), XRF (X-ray fluorescence), XRD (X-ray
diffraction) and others.

Jordan Valley’s investors include Clal Industries and Investments Ltd. (TASE: CII),
Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE: ELRN).

With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK,
Austin TX, USA, Hsin-Chu Taiwan, Suwon Korea, and other offices and sales representatives
worldwide.

        For more information:
        Gali Ashkenazi
        Tel: +972-4654-3666
        Tel: +1-512-832-8470
        gali.ashkenazi@jordanvalley.com

http://www.jordanvalley.com

SOURCE Jordan Valley Semiconductors Ltd.


Source: PR Newswire



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