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GuideTech Demonstrates Production Test Solution for PCI EXPRESS With NVIDIA(R) GeForce(R) 6800 Graphics Card at ITC 2005

Posted on: Wednesday, 9 November 2005, 09:00 CST

SUNNYVALE, Calif., Nov. 9 /PRNewswire/ -- GuideTech, the leader in Production Test Solutions for Critical Timing Test, will demonstrate a high performance Test Suite for PCI EXPRESS, with GuideTech's new GT4000 CTIA system testing the PC industry's PCI Express gold standard NVIDIA(R) GeForce(R) 6800 graphics card at ITC 2005. The Test Suite includes Functional Test, Jitter Separation (RJ, DDJ, PJ, TJ), Eye width, BER, and more, with accuracy, resolution and test times that are far beyond the performance of alternate solutions in the industry. Integrated on a wide range of ATE platforms, the enhanced performance and increased accuracy of the GT4000 cut the cost of test for multi-gigabit serial interfaces, by providing high throughput and parallel test capability on multiple channels. GuideTech proprietary CTIA Technology provides Functional Test with no need for pattern markers or CDR circuits.

"We have learned from customers who are using DFT and loopback methodologies, that our advanced CTIA technology enhances and complements the test coverage needed to guarantee performance to specification for their high end products," stated Mr. Bob Raybuck, GuideTech president & CEO. "The powerful suite of our GT4000 DCA signal integrity analysis tools enhances SOC ATE with the ability to analyze and separate jitter of asynchronous and non-deterministic serial signals, with unprecedented throughput which is a key element for cost effective High Volume Production Test."

About GuideTech

GuideTech is the leading innovator in high-performance timing measurement instruments, providing semiconductor manufacturers with the solution they need to minimize timing-related component failure and to dramatically reduce production test costs through test-time reduction and extended ATE lifecycles. Based on patented Continuous Time Interval Analyzer (CTIA) technology, the company's FEMTO 2000 and GT4000 families of multi-channel timing test systems and accompanying Datacom Analysis software substantially improve test throughput via fast measurement rates, far greater measurement and analysis accuracy, and the ability to handle asynchronous or non-deterministic signals without external arming on up to 32 or 64 channels. These capabilities, which are strongly linked to GuideTech's unique CTIA technology, enable critical, high-speed, functional, timing and jitter test coverage for PLLs and multi-gigabit serial interfaces such as PCI Express, in milliseconds, in parallel, and in production. Headquartered in Sunnyvale, CA, the company is the first to deliver cost-effective, advanced timing measurement solutions that easily integrate onto any ATE platform. For more information, please contact Tammy L. McClure at 408-731-8857 or tammy@guidetech.com. Visit the company's Website at http://www.guidetech.com/.

GuideTech

CONTACT: Tara Bal of e21 Corp, +1-510-226-6780, ext. 162, ortara.bal@e21mm.com, for GuideTech

Web site: http://www.guidetech.com/

Source: PRNewswire

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