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Semiconductor Test Consortium Announces Revision 1.0 of OPENSTAR(TM) Standard Specification

Posted on: Tuesday, 13 July 2004, 06:00 CDT

SEMICON WEST, SAN JOSE, Calif., July 13 /PRNewswire/ -- The Semiconductor Test Consortium, Inc. (STC, San Diego, Calif.) today announced it has released the first major revision of the specification for the Open Semiconductor Test Architecture (OPENSTAR(TM)). Approved by the STC voting member companies during the consortium's recent general and technical working group meeting, Revision 1.0 of the specification covers a wide range of both hardware and software parameters.

"We are very pleased to be able to provide the industry with a greatly expanded set of specifications for the OPENSTAR standard," said Fred Bode, STC manager and secretary. "In our first year as a fully incorporated non-profit organization, we have made great strides toward achieving broad acceptance and adoption of OPENSTAR. This new version of the specification will facilitate development of interoperable mainframes and a variety of modules by suppliers throughout the industry, further advancing our goal of enabling device makers to cost-effectively create customized test solutions."

Key components of the updated OPENSTAR specification include:

-- Hardware -- Fiber Optic Protocol, Exterior 400x480, 20A Power

Connector, 48V Power, Air-Cooling, Cooling Fluorinert, Ground, T2000

Securing, 1Gbps Fiber Optic Physical, Digital Synchronization, Digital

250M Timing, Digital Synchronization Connector, DVM Connector, and

Power Sequence & Fault.

-- Software -- Tools Development Environment and API Extension, Tool

Proxy, Datalog Interfaces, Device Simulation Interfaces, Error

Handling, Alarm Handling, Test Programming Language, Configuration

Database and Profile Management, Installation/Activation/Version

Switch, Resource Definition Language, System Configuration Language,

Pin Description Language, Socket Language, Environmental and Global

Variables, Tester Operating System Installation Configuration, System

Initialization, Pre-Execution, and Module Simulation.

Designed to enable open test solutions that offer true hardware and software interoperability, with unparalleled technical and economic benefits, the OPENSTAR platform is now supported by more than 27 semiconductor, equipment and instrumentation companies worldwide. Founding members of the consortium include Advantest Corp., GuideTech, Inc., Inovys Corp., Intel Corp., Motorola, Inc., Pragmatics Technologies, Inc., Racal Instruments, Roos Instruments, Inc., StarGen, Inc., and Wavecrest Corp. Rev 1.0 of the OPENSTAR specification is available to STC members at the STC web site ( http://www.semitest.org/ ).

About the Semiconductor Test Consortium

The Semiconductor Test Consortium was founded in 2003 to develop a common test architecture that is completely open, documented and supported via solutions available from all ATE vendors. Open to all companies throughout the semiconductor supply chain with a vested interest in the test sector, the consortium is focused on the following goals: driving the direction of OPENSTAR; publishing the architecture and providing training programs and workshops to ensure it is truly open; and defining and managing validation procedures to ensure full vendor interoperability. More than 20 semiconductor, equipment and instrumentation companies worldwide and nine universities in Europe, Japan, China and the United States now support the STC. More information on members, benefits and membership materials can be found at http://www.semitest.org/.

Semiconductor Test Consortium

CONTACT: Fred Bode of Semiconductor Test Consortium, +1-619-297-1210, orfbode@vxinl.com; or media, Evelyn Tay of MCA, +1-650-968-8900, oretay@mcapr.com

Web site: http://www.semitest.org/

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