Latest AFM probe Stories
New high aspect ratio (HAR) carbon probe technology for atomic force microscopy (AFM).
NANOSENSORS publishes an English and a Chinese screencast on its new uniqprobes for atomic force microscopy (AFM) and scanning probe microscopy (SPM), which explains the advantages of the main
JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements.
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution
NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). Nechatel,
MarketReportsOnline.com adds “Scanning Probe Microscopes: The Global Market” report to its research library.
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolutionfor
Wear is a fact of life. As surfaces rub against one another, they break down and lose their original shape. With less material to start with and functionality that often depends critically on shape and surface structure, wear affects nanoscale objects more strongly than it does their macroscale counterparts.
One of the most promising innovations of nanotechnology has been the ability to perform rapid nanofabrication using nanometer-scale tips.
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