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Latest Atomic force microscopy Stories

gold coated nanowire probe
2014-08-17 02:05:27

Australian National University Cooling a nanowire probe with a laser could lead to substantial improvements in the sensitivity of atomic force probe microscopes Laser physicists have found a way to make atomic-force microscope probes 20 times more sensitive and capable of detecting forces as small as the weight of an individual virus. The technique, developed by researchers at The Australian National University (ANU), hinges on using laser beams to cool a nanowire probe to minus 265...

2014-06-24 23:04:33

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano technology tool providers for research labs and industry, invites Semicon West attendees to an exciting AFM luncheon and reception, featuring guest speaker Phil Kaszuba who currently directs the Scanning Probe Microscopy Laboratory at IBM. The luncheon, open to AFM users, will be held in conjunction with Semicon West on July 9 from 11:30-2:30 at Jillian’s Restaurant, courtesy of Park Systems. Santa...

2014-06-23 23:12:26

NANOSENSORS publishes an English and a Chinese screencast on its new uniqprobes for atomic force microscopy (AFM) and scanning probe microscopy (SPM), which explains the advantages of the main characteristics of uniform quality AFM probes for biology and life science applications. Neuchâtel, Switzerland (PRWEB) June 23, 2014 NANOSENSORS™ announced that a screencast explaining the properties of a completely new SPM (Scanning Probe Microscopy) probe series dedicated for use in...

2014-06-11 23:10:43

Nanoscience Instruments, an industry leader providing scientific instruments to investigate the micro and nanoscale world, is pleased to announce a new line of scanning probe microscopes: the traxAFM and traxSTM systems. Phoenix, AZ (PRWEB) June 11, 2014 The new lines of atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are available exclusively from Nanoscience Instruments. The traxAFM and traxSTM systems provide an affordable solution for routine AFM and STM...

2014-05-28 23:12:45

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces its next generation NX-PTR, a fully automated system for hard disk drive slider manufacturing. Newly developed in collaboration with leaders in the hard disk drive (HDD) production, Park’s NX-PTR increases production yield by 200% with an enhanced automation routine, faster scan rate and recipe automation. Santa Clara, CA (PRWEB) May 28, 2014 Park Systems, a leading manufacturer of atomic...

2014-04-21 23:04:07

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor, material and biological science and data storage markets, announced today that its founder and CEO, Dr. Sang-il Park, will present at the MRS Spring Meeting in San Francisco. The presentation titled Crosstalk Eliminated Atomic Force Microscope and Dimensinal Nanometrology for Inline Manufacturing Control will be given on April 23 at 11am in room 3010, level 3 Moscone West. Santa Clara, CA (PRWEB) April 21,...

Researchers Develop Short, Flexible, Reusable AFM Probe
2014-04-10 12:47:04

NIST JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer and more agile than standard and recently enhanced AFM probes, the JILA tips will benefit nanotechnology and studies of folding and stretching in biomolecules such as proteins and DNA. An AFM probe is a cantilever, shaped like a tiny diving board with a small, atomic-scale...

2014-04-01 23:24:39

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers. Santa Clara, CA (PRWEB) April 01, 2014 Park Systems, a leading manufacturer of...

2014-03-04 23:27:21

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry. The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM thereby providing the most optimum solution to the FA engineers’ needs available in the nanotechnology industry today. Santa...

2014-02-19 23:23:15

NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). Nechatel, Switzerland (PRWEB) February 19, 2014 NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe...


Word of the Day
grass-comber
  • A landsman who is making his first voyage at sea; a novice who enters naval service from rural life.
According to the OED, a grass-comber is also 'a sailor's term for one who has been a farm-labourer.'