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Latest Atomic force microscopy Stories

2014-02-13 08:35:53

DUBLIN, Feb. 13, 2014 /PRNewswire/ -- Research and Markets ( http://www.researchandmarkets.com/research/6hxmn2/scanning_probe ) has announced the addition of the "Scanning Probe Microscopes: The Global Market to 2020" report to their offering. (Logo: http://photos.prnewswire.com/prnh/20130307/600769) The Scanning Probe Microscope (SPM) market in 2013 generated approximately $440 million in revenues (conservative estimate). Atomic Force Microscopes (AFM) accounted for the majority of this...

2014-02-01 23:01:40

MarketReportsOnline.com adds “Scanning Probe Microscopes: The Global Market” report to its research library. It includes market revenues, current and forecasted to 2020. Dallas, Texas (PRWEB) February 01, 2014 The Scanning Probe Microscope (SPM) market in 2013 generated approximately $440 million in revenues (conservative estimate). Atomic Force Microscopes (AFM) accounted for the majority of this market with Scanning tunneling microscope (STM) and NSOM making up less than 10%. The...

2014-01-30 23:04:59

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University. Her winning submission is an AFM image taken using Park XE Bio of a HeLa Cell used in her research studying drug delivery methods for cancer research. Santa Clara, CA (PRWEB) January 30, 2014 Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest...

2013-12-18 23:02:50

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSampleTM scan. This newly developed large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples. Santa Clara, CA (PRWEB) December 18, 2013 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the...

2013-12-18 11:24:32

Innovation could lead to faster drug therapies and increased understanding of proteins on the microscopic level Membrane proteins are the “gatekeepers” that allow information and molecules to pass into and out of a cell. Until recently, the microscopic study of these complex proteins has been restricted due to limitations of “force microscopes” that are available to researchers and the one-dimensional results these microscopes reveal. Now, researchers at the University of Missouri...

Researchers Observe High Energy Losses In Vicinity Of Charge Density Waves
2013-12-16 07:29:11

University of Basel In collaboration with the University of Basel, an international team of researchers has observed a strong energy loss caused by frictional effects in the vicinity of charge density waves. This may have practical significance in the control of nanoscale friction. The results have been published in the scientific journal Nature Materials. Friction is often seen as an adverse phenomenon that leads to wear and causes energy loss. Conversely, however, too little friction...

2013-11-25 23:20:30

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 is exhibiting at the Fall MRS Material Research Society Meeting and Exhibit Dec 3-5, 2013 at the Hynes Convention Center in Boston, MA. Visit the Park Systems at Booth 416 at MRS 2013 and find out more about their latest innovations in AFM technology including new software just introduced that improves accuracy and precision at the nanoscale level. Santa Clara, CA (PRWEB) November 25, 2013 Park Systems, a leader in Atomic...

2013-10-30 23:21:02

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series, the leading AFM products for researchers and engineers in the semiconductor industry, Park’s QuickStep SCM provides accurate dopant profiles of semiconductor device structures, 5 to 10 times faster than any other competing SCM atomic...

2013-10-08 23:03:12

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces its 2013 Boston User Group and Luncheon concerning AFM-related issues to be held on October 21st, 9:30-2:30 and October 22nd, 9:30-6:30. Santa Clara, CA (PRWEB) October 08, 2013 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces its 2013 Boston User Group and Luncheon concerning AFM-related issues to be held on October 21st as well as its Boston AFM Roadshow on...

2013-09-25 23:01:08

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolutionfor failure analysis (FA) in the semiconductor industry. Santa Clara, CA (PRWEB) September 25, 2013 Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale...


Word of the Day
kenspeckle
  • Having so marked an appearance as easily to be recognized.
This word may come from the Swedish 'kanspak,' quick at recognizing persons or things, or else from confusion with 'conspicuous.'