Latest Atomic force microscopy Stories
JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution
NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). Nechatel,
MarketReportsOnline.com adds “Scanning Probe Microscopes: The Global Market” report to its research library.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSampleTM
Membrane proteins are the “gatekeepers” that allow information and molecules to pass into and out of a cell.
An international team of researchers has observed a strong energy loss caused by frictional effects in the vicinity of charge density waves. This may have practical significance in the control of nanoscale friction. The results have been published in the scientific journal Nature Materials.
- An imitative word; an onomatopoetic word.