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Latest Atomic force microscopy Stories

2013-08-31 23:02:13

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, is exhibiting at the 246th Fall ACS National Meeting and Exposition Sept 8-12, 2013 in Indianapolis, IN. Showcased at the Park Systems booth will be Park NX10, the industry’s most accurate AFM, and the two new AFM advanced features: Step and Scan Automation, a feature that makes Park AFM very easy to use, and Approach Retract Scanning, a conductive AFM mode that greatly increases the resolution and bandwidth for...

2013-08-29 23:04:11

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest beginning Aug 29-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM. Twelve selected winners judged on image quality, visual appearance, and highly interesting application will appear in the Park Systems 2014 calendar with an image caption and credit under image, identifying the winning researcher. Santa Clara, CA (PRWEB) August 29, 2013 Park...

2013-07-19 16:01:37

For a car to accelerate there has to be friction between the tire and the surface of the road. The amount of friction generated depends on numerous factors, including the minute intermolecular forces acting between the two surfaces in contact – so-called van der Waals forces. The importance of these intermolecular interactions in generating friction has long been known, but has now been demonstrated experimentally for the first time by a research team led by Physics...

2013-07-18 23:00:44

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces an exclusive promotion that offers buyers of the Park XE7 a complimentary acoustic enclosure and vibration table valued at $10,000 by submitting a request for quote (RFQ) by Oct 31, 2013. Given the impressive demand for the Park XE7, this one-time-only event is Park's expression of thanks for the international success and popularity of this product. Santa, Clara, CA (PRWEB) July 18, 2013 Park...

2013-07-03 23:01:32

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM, a fully automated automatic defect review and sub-angstrom surface roughness atomic force microscopy (AFM) system for device substrates and disk media, the first metrology tool capable of providing this level of accuracy and automation. The NX-HDM system sets a new standard for the industry in automatic defect review AFM technology by increasing throughput up to...

2013-07-01 23:21:17

Park Systems, leader in Atomic Force Microscope, is holding a SEMICON West reception on July 10 at Hotel Palomar's Fifth Floor. Attendees, Researchers and Engineers are invited to hear about cutting edge breakthroughs in AFM nanotechnology from Park experts. Santa Clara, CA (PRWEB) July 01, 2013 Park Systems, Inc., a leader in atomic force microscopy (AFM), is hosting a SemiconWest Reception in San Francisco on Wed. July 10, 2013 at the Hotel Palomar from 11:30 am -2:30pm. At the...

2013-06-11 23:15:08

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of the Park XE7, the scientific industry´s most affordable, research-grade AFM with innovative design features. The Park XE7 provides AFM researchers with a cost-effective solution, which includes Park´s proprietary technology, without compromising quality or functionality, a key distinction from more conventional AFMs. Santa Clara, CA (PRWEB) June 11, 2013 Park Systems, a leading...

2013-06-04 23:18:52

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano metrology tools for research labs and industry has recently announced a 90 percent market share in the disc storage market for AFM. Park AFM offers superior technology and performance unmatched by the competition, specifically the highest accuracy in nanoscale due to the independent XY stage and Z scanner architecture, and flexure based design, the low operating cost by its unique True Non-Contact AFM, and...

Molecules Captured At Work During Graphene Research
2013-05-31 11:30:19

Rebekah Eliason for redOrbit.com — Your Universe Online One of the hottest topics in chemical research right now is the study of graphene. This cutting edge compound, composed of a single layered sheet of hexagonal carbon atoms linked together, could be the next step in designing nanostructures for electronics and next-generation computers. Graphene nanostructures have the potential to form transistors, logic gates, and other parts for use in tiny electronic devices, but...

2013-05-10 23:24:40

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review. Park NX20 is designed to guarantee reliable, reproducible results for better output in failure analysis (FA) and quality assurance (QA) laboratories. Santa Clara, CA (PRWEB) May 10, 2013 Park Systems, world leader in atomic...


Word of the Day
endocarp
  • The hard inner (usually woody) layer of the pericarp of some fruits (as peaches or plums or cherries or olives) that contains the seed.
This word comes from the Greek 'endon,' in, within, plus the Greek 'karpos', fruit.
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