Latest Atomic force microscopy Stories
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest beginning Aug 29-Nov 1, 2013 for scientists, engineers, researchers and others
For a car to accelerate there has to be friction between the tire and the surface of the road.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces an exclusive promotion that offers buyers of the Park XE7 a complimentary acoustic enclosure and vibration
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM, a fully automated automatic defect review and sub-angstrom surface
Park Systems, leader in Atomic Force Microscope, is holding a SEMICON West reception on July 10 at Hotel Palomar's Fifth Floor.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of the Park XE7, the scientific industry’s most affordable, research-grade AFM with innovative
Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano metrology tools for research labs and industry has recently announced a 90 percent market share in the disc
Felix Fischer of the U.S. Department of Energy's Lawrence Berkeley National Laboratory has been actively studying the process of building graphene, but in the process he and his fellow researchers discovered a powerful technique to capture pictures of molecules before and after they react with each other.
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces Park NX20, an enhanced design of the already successful XE series that assures
Park Systems, a leader in Atomic Force Microscopy since 1997 is offering a Park User Group session to current Park Systems AFM users on Tuesday, May 7, 2013 at the Hilton Double Tree in Austin
- A person in a secondary role, specifically the second most important character (after the protagonist).