Latest Atomic force microscopy Stories
Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano metrology tools for research labs and industry has recently announced a 90 percent market share in the disc
Felix Fischer of the U.S. Department of Energy's Lawrence Berkeley National Laboratory has been actively studying the process of building graphene, but in the process he and his fellow researchers discovered a powerful technique to capture pictures of molecules before and after they react with each other.
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces Park NX20, an enhanced design of the already successful XE series that assures
Park Systems, a leader in Atomic Force Microscopy since 1997 is offering a Park User Group session to current Park Systems AFM users on Tuesday, May 7, 2013 at the Hilton Double Tree in Austin
A new technique based on atomic force microscopy was developed at the Institute of Food Research to help ‘read’ information encoded in the gut lining.
For more than 20 years, researchers have been using atomic force microscopy (AFM) to measure and characterize materials at the nanometer scale.
Wear is a fact of life. As surfaces rub against one another, they break down and lose their original shape. With less material to start with and functionality that often depends critically on shape and surface structure, wear affects nanoscale objects more strongly than it does their macroscale counterparts.
One of the most promising innovations of nanotechnology has been the ability to perform rapid nanofabrication using nanometer-scale tips.
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