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Last updated on April 23, 2014 at 10:32 EDT

Latest e-beam Stories

2013-04-23 12:21:57

New e-beam vacuum deposition system produces superior coatings, dramatically increases the size of the optical components that can be coated. NORTHVALE, N.J., April 23, 2013 /PRNewswire/ -- Inrad Optics, Inc. (OTBB: INRD) has advanced its thin film coating capabilities with the installation of a new plasma assisted e-beam vacuum deposition system. The new coating system employs high-density plasma technology to dramatically enhance the quality of thin films by improving a wide...

2013-01-29 16:26:24

MILPITAS, Calif., Jan. 29, 2013 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced the eS805(TM), a new electron-beam inspection system for leading-edge chip manufacturers. Benefiting from more than twenty years of KLA-Tencor's e-beam inspection development and manufacturing expertise, the eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, such as opens, shorts or reliability issues. The...

2012-01-19 15:15:00

MILPITAS, Calif., Jan. 19, 2012 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC), announced three new wafer defect inspection systems for leading-edge chip manufacturers: the 2900, Puma 9650 and eS800 systems. This new flagship suite is designed to address the wide range of defect issues that new materials, structures and design rules have imposed on manufacturers of advanced chips. The new 2900 Series broadband optical wafer defect inspection platform extends optical wafer...

2011-08-15 15:15:00

MILPITAS, Calif., Aug. 15, 2011 /PRNewswire/ -- Today KLA-Tencor Corporation(TM) (NASDAQ: KLAC) announced a critical enabling tool for chip manufacturing at the 20nm device nodes and below: the eDR(TM)-7000 electron-beam (e-beam) wafer defect review system. Featuring technology breakthroughs that produce industry-leading sensitivity and throughput, the eDR-7000 addresses defect imaging and classification challenges at today's leading edge--where yield-killing defects can be as small as...

2011-03-18 12:43:00

PALM SPRINGS, Calif., March 18, 2011 /PRNewswire/ -- Luidia, Inc., the award-winning leader in development of interactive systems that allow users to create, capture and share digital content and deliver it in an engaging way, today debuted its dynamic collection of new products and interactive education capabilities to the California audience at Computer-Using Educators, Inc.'s annual CUE 2011 Conference. Luidia's ecosystem of interactive education products provide affordable interactive...

2011-02-22 11:00:00

SAN JOSE, Calif., Feb. 22, 2011 /PRNewswire/ -- The eBeam Initiative, a forum dedicated to the education and promotion of a new design-to-manufacturing approach known as design for e-beam (DFEB), today announced that several of its members will present the latest breakthroughs in DFEB mask and direct write technology at the Annual SPIE Advanced Lithography Symposium 2011. In the area of DFEB mask, for example, the collaborative results demonstrate the effectiveness of DFEB technology in...

2011-02-09 07:01:00

AUSTIN, Texas, Feb. 9, 2011 /PRNewswire/ -- Luidia, Inc., the award-winning leader in development of interactive systems that allow users to create, capture and share digital content and deliver it in an engaging way, today debuted a dynamic collection of new products and interactive education capabilities at the TCEA 2011 Convention and Exposition. Held this year from February 7-11, 2011 in Austin, Texas, this five-day show is one of the largest educational technology conventions in...

2011-02-09 07:01:00

AUSTIN, Texas, Feb. 9, 2011 /PRNewswire/ -- Luidia, Inc., the innovative developer of interactive technology and solutions, today announced that Hitachi's projector division has selected Luidia's award-winning eBeam® technology to power Hitachi's Ultimate Short Throw Interactive Projector. The new Hitachi iPJ-AW250N incorporates Luidia's award-winning eBeam interactive technology to create a premium platform for capturing and sharing ideas by transforming flat surfaces...

2011-02-02 16:17:00

AMSTERDAM, Feb. 2, 2011 /PRNewswire/ -- Luidia, Inc., the global award-winning developer of interactive solutions, today announced a new partnership with Chief, the industry leader in professional AV mounting solutions. Luidia's eBeam technology will be integrated into Chief's award-winning Short Throw Projector Mount Line. The announcement was made today at the Integrated Systems Europe (ISE) Show in Amsterdam where Chief is demonstrating the new eBeam enabled interactive mount at stand...

2011-01-11 07:00:00

SAN CARLOS, Calif., Jan. 11, 2011 /PRNewswire/ -- Luidia, Inc., the award-winning leader in development of interactive systems that allow users to create, capture and share digital content and deliver it in an engaging way, today announced the company completed a banner year in 2010 - capped by significant year-over-year growth. The 2010 momentum was fueled by the release of a new line of eBeam technology products, nine new partnerships with global hardware, software and content OEMs and...