Latest Electronic test equipment Stories

CLEVELAND, Feb. 7, 2011 /PRNewswire/ -- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free webinar on "Hall Effect Measurement Fundamentals" on Thursday, February 17, 2011. This one-hour presentation will introduce Hall effect measurements as they relate to semiconductor materials and device characterization. The on-line event also features an interactive Q&A session. To register, visit...

In a paradox typical of the quantum world, JILA scientists have eliminated collisions between atoms in an atomic clock by packing the atoms closer together. The surprising discovery, described in the Feb. 3 issue of Science Express, can boost the performance of experimental atomic clocks made of thousands or tens of thousands of neutral atoms trapped by intersecting laser beams.JILA is jointly operated by the National Institute of Standards and Technology (NIST) and the University of Colorado...

CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif., Feb. 3, 2011 /PRNewswire/ -- LeCroy Corporation (Nasdaq: LCRY) premiered an array of innovative new products at DesignCon 2011, demonstrating continued leadership in the speed, performance and analysis capabilities of oscilloscopes and signal integrity test solutions. LeCroy engineers were available for discussion on the exhibition floor, presented four technical sessions and delivered one three-hour tutorial. The product lineup included the new...

SANTA CLARA, Calif., Feb. 1, 2011 /PRNewswire/ -- Anritsu Company introduces a jitter tolerance and 4Tap pre-emphasis solution specifically designed to test interconnects up to 28 Gbit/s, at DesignCon 2011. Developed to meet the signal integrity requirements associated with designing backplanes for today's high-speed interconnects, such as Infiniband 26G-IB-EDR, CEI-25G, CEI-28G-VSR, PCI Express, SAS, SATA, FB-DIMM, USB 3.0 and Display Port, the solution allows engineers to ensure their...

CHESTNUT RIDGE, N.Y., Feb. 1, 2011 /PRNewswire/ -- LeCroy Corporation (Nasdaq: LCRY), a leading supplier of oscilloscopes, protocol analyzers and serial data test solutions, today announced the launch of WaveRunner 6 Zi, its newest mid-range oscilloscope series. The new platform is the latest design in a comprehensive rollout of technology-leading products that LeCroy initiated in the fall of 2010. (Photo: http://photos.prnewswire.com/prnh/20110201/NE39987 ) "LeCroy's first WaveRunner...

SANTA CLARA, Calif., Feb. 1, 2011 /PRNewswire/ -- DesignCon -- LeCroy Corporation, the worldwide leader in protocol test solutions, today introduced a new low-cost platform that provides comprehensive DDR3 bus and JEDEC timing analysis. LeCroy's Kibra(TM) 380 is the industry's first true, standalone protocol analyzer for DDR3, combining waveform views and state listings, with dedicated trigger logic to allow improved visualization of DDR3 state transitions and protocol violations. Designed...

SANTA CLARA, Calif., Feb. 1, 2011 /PRNewswire/ -- DesignCon -- LeCroy Corporation, a leading supplier of serial data test solutions, today introduced a new protocol analyzer that provides a powerful and extremely cost-effective solution for any applications requiring PCIe 2.0 speeds and functionality. The new compact Summit(TM) T28 Protocol Analyzer features a small chassis footprint while maintaining (for lane widths up to x8) the same data recording and analysis features found in the...

CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif., Jan. 28, 2011 /PRNewswire/ -- LeCroy Corporation (Nasdaq: LCRY), a leading supplier of oscilloscopes and serial data test solutions, today announced that its 45 GHz WaveMaster 845 Zi-A oscilloscope was the winner of the annual DesignVision Award presented by UBM Electronics in the Test and Measurement Equipment category at DesignCon 2011. The WaveMaster 845 Zi-A, the world's highest bandwidth real-time oscilloscope, was selected based on market...

CLEVELAND, Jan. 20, 2011 /PRNewswire/ -- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced several enhancements to its line of S530 Parametric Test Systems, the most cost-effective fully automatic production parametric test solutions available to the semiconductor industry. These enhancements include the addition of Keithley's new high throughput switch mainframe for high integrity signal switching, full Kelvin measurements at...

CLEVELAND, Jan. 12, 2011 /PRNewswire/ -- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published its 2011 Test & Measurement Product Catalog in CD form. The CD offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, Digital Multimeters, RF/microwave switching, data acquisition solutions, and semiconductor test systems. Useful selector guides and...