Latest Ellipsometry Stories

2015-02-17 08:30:03

LONDON, Feb. 17, 2015 /PRNewswire/ -- About Thin-film Metrology SystemsThin film metrology systems are used to measure the film thickness accurately.

2014-04-10 04:20:14

Including a Distinctive Portable Type

2011-09-05 04:20:01

'UNECS-3000A' Dramatically Improved Performance Through an Automatic High-Speed Mapping Function Chigasaki, Japan, Sept 5, 2011 - (JCN

2011-06-16 06:00:00

MIGDAL HA'EMEK, Israel, June 16, 2011 /PRNewswire/ -- Jordan Valley Semiconductors Ltd., a leading provider of X-ray metrology solutions for advanced semiconductor fabs, announced today the delivery of a follow-on order of its JVX7200 and JVX6200 thin-film metrology systems for a major foundry in the Far East. "This repeat order clearly shows the customer's confidence in our system's enabling capabilities and production worthiness," said Mr.

2010-08-04 15:15:00

MILPITAS, Calif., Aug. 4 /PRNewswire-FirstCall/ -- Today KLA-Tencor Corporation (Nasdaq: KLAC), the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the latest addition to the Aleris family of film metrology tools.

Word of the Day
  • An armed gangster.
The word 'shotta' is an alteration of 'shooter'.