Latest Ellipsometry Stories
Including a Distinctive Portable Type
'UNECS-3000A' Dramatically Improved Performance Through an Automatic High-Speed Mapping Function Chigasaki, Japan, Sept 5, 2011 - (JCN
MIGDAL HA'EMEK, Israel, June 16, 2011 /PRNewswire/ -- Jordan Valley Semiconductors Ltd., a leading provider of X-ray metrology solutions for advanced semiconductor fabs, announced today the delivery of a follow-on order of its JVX7200 and JVX6200 thin-film metrology systems for a major foundry in the Far East. "This repeat order clearly shows the customer's confidence in our system's enabling capabilities and production worthiness," said Mr.
MILPITAS, Calif., Aug. 4 /PRNewswire-FirstCall/ -- Today KLA-Tencor Corporation (Nasdaq: KLAC), the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the latest addition to the Aleris family of film metrology tools.
- To swell, as grain or wood with water.