Last updated on April 17, 2014 at 1:21 EDT

Latest Evergreen Enhancement Inc. Stories

2013-01-14 23:00:24

Sample precise thickness, relative shape and local variations of a number of substrate wafers using our unique new metrology technique and equipment -- at no cost! Canton, Massachusetts (PRWEB) January 14, 2013 Evergreen Enhancement — http://www.evergreenenhancement.com — developer and manufacturer of leading-edge metrology systems, is offering semiconductor makers an opportunity to sample a variety of characteristics of their products. According to Bill Kerr, Evergreen...