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Last updated on April 18, 2014 at 7:15 EDT

Latest Eye pattern Stories

2013-01-28 12:29:18

AUSTIN, Texas, Jan. 28, 2013 /PRNewswire/ -- National Instruments (Nasdaq: NATI) today announced the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer, with 10 bits of vertical resolution and a 5 GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1.5 GHz of bandwidth and four channels in a single slot, the NI PXIe-5162 is suited for high-channel-count digitizer systems in...

2012-07-05 02:25:15

CHESTNUT RIDGE, N.Y., July 5, 2012 /PRNewswire/ -- LeCroy Corporation announces today SDAIII-CompleteLinQ - the only serial data analysis package that simultaneously performs eye, jitter, vertical noise, and crosstalk analysis on up to four lanes, with quick and easy lane-to-lane comparisons. (Photo: http://photos.prnewswire.com/prnh/20120705/NE35363) SDAIII-CompleteLinQ Solves Multi-Lane Serial Data Analysis Challenges Mobile and cloud computing is driving demand for higher data...

2011-04-11 16:30:00

CHESTNUT RIDGE, N.Y., April 11, 2011 /PRNewswire/ -- LeCroy Corporation's lineup of physical layer test instruments provides complete transmitter and receiver electrical physical layer testing for the new Thunderbolt® serial data standard. LeCroy's SDA 8 Zi-A Serial Data Analyzers, SDA II and Eye Doctor® II analysis software, SPARQ(TM) Signal Integrity Network Analyzers, and PeRT3® Protocol-enabled Receiver Transmitter Tolerance Testers...