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Latest KLA Tencor Stories

2015-02-25 16:30:29

REHOVOT, Israel, February 25, 2015 /PRNewswire/ -- Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and key provider of optical metrology solutions for advanced

2015-02-25 08:28:48

Former Ariba CEO also serves on the board of directors for Citrix Systems, Juniper Networks and KLA-Tencor SAN FRANCISCO, Feb.

2015-02-19 16:35:00

Comprehensive Overlay and Films Process Control Solutions Address Advanced IC Process Challenges MILPITAS, Calif., Feb.

2015-02-17 12:35:48

Holon and Photronics become latest companies to join eBeam Initiative SAN JOSE, Calif., Feb.

2015-02-17 08:30:03

LONDON, Feb. 17, 2015 /PRNewswire/ -- About Thin-film Metrology SystemsThin film metrology systems are used to measure the film thickness accurately.

2015-02-17 04:23:04

Continuous collaboration with leading wafer fabrication equipment supplier yields an advanced real-time process monitoring solution REHOVOT, Israel, February 17, 2015 /PRNewswire/ --

2015-02-03 23:03:40

Global Thin Film Metrology Systems Market 2015-2019 is a new research report added to Sandlerresearch.org store.

2015-01-22 16:27:34

MILPITAS, Calif., Jan.


Word of the Day
orbity
  • A bereavement by loss of parents or children; the state of being orbate; orbation.
The word 'orbity' ultimately comes from a Latin word meaning 'bereaved'.