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Last updated on April 23, 2014 at 10:42 EDT

Latest magnetic metrology systems Stories

2013-01-25 12:26:53

LOWELL, Mass., Jan. 25, 2013 /PRNewswire/ -- MicroSense, LLC, a worldwide leader in high sensitivity vibrating sample magnetometers (VSMs), magnetic metrology systems, high resolution capacitive sensors, and wafer metrology systems, today announced that it has booked and shipped multiple customer orders for its next generation "EZ" series VSM magnetic metrology systems from global customers. These VSM metrology systems are used to characterize the magnetic properties of magnetic thin films...