Latest metrology tool Stories
Park Systems Introduces Park NX-HDM: Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM, a fully automated automatic defect review and sub-angstrom surface
Word of the Day
- The word or words serving to define another word or expression, as in a dictionary entry.
The word 'definiens' comes from the Latin word 'definire', 'to define'.