Latest metrology tool Stories
Park Systems Introduces Park NX-HDM: Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates
Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX-HDM, a fully automated automatic defect review and sub-angstrom surface
Word of the Day
- An interdisciplinary study of social injustice.