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Latest Metrology Stories

2014-07-23 23:19:49

The OHAUS Explorer has won Laboratory Equipment magazine's 2014 Readers' Choice Award for best balance for the second consecutive year. Parsippany, NJ (PRWEB) July 22, 2014 OHAUS Corporation, a leading worldwide manufacturer of analytical, precision, portable, and mechanical balances and scales, proudly announces its Explorer line of analytical and precision balances has won Laboratory Equipment magazine’s 2014 “Readers' Choice” Award for best balance. This is the...

2014-07-08 08:36:50

Nova V2600(TM) qualified as tool of record for logic and memory applications REHOVOT, Israel, July 8, 2014 /PRNewswire/ -- Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that a major customer in Asia placed an order for its Through-Silicon-Via (TSV) metrology solution. This is the first order from this customer for Nova's TSV...

2014-07-07 08:30:45

MIGDAL HAEMEK, Israel, July 7, 2014 /PRNewswire/ -- Jordan Valley Semiconductors [http://www.jordanvalley.com ] Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has recently delivered and successfully commissioned its JVX7300L in-line X-ray metrology tool at multiple customers. The systems have been purchased for in-fab process development and automated production monitoring of GaN on Si wafers....

2014-07-03 12:27:55

MIGDAL HAEMEK, Israel, July 3, 2014 /PRNewswire/ -- Jordan Valley Semiconductors Ltd. [http://www.jordanvalley.com [https://webmail.jvsemi.com/exchweb/bin/redir.asp?URL=http://www.jordanvalley.com ]], a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that its micro-spot X-ray Fluorescence (microXRF) metrology tool has been qualified for production monitoring of advanced Wafer Level Packaging (WLP) processes, by...

2014-06-30 23:04:57

Turnkey manufacturing solutions provider, MME group, is pleased to announce the latest addition to their lineup of quality lab manufacturing equipment—the state-of-the-art Micro-Vu Excel 502 coordinate measuring machine (CMM). St. Paul, MN (PRWEB) June 30, 2014 A CMM is a device used to perform dimensional, positional, and surface measurement in a single system. At MME group, the multisensory measurement machine is used for fast and precise plastics manufacturing. The CMM implements new...

2014-06-30 08:35:35

Conference call to be held at 8:30am Eastern Time REHOVOT, Israel, June 30, 2014 /PRNewswire/ -- Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that it will release its results for the second quarter of 2014 before the market opens on July 30, 2014. Mr. Eitan Oppenhaim, President and Chief Executive Officer and Mr. Dror...

2014-06-26 23:15:52

MSI-Viking customers saw the ShaPix 1500 versatility on measurement of form and waviness demonstrated during a Dr. Mark Malburg seminar at MSI-Viking in Duncan, SC. Ann Arbor, Michigan (PRWEB) June 26, 2014 MSI Viking customers gained knowledge and experience in understanding waviness and its impact on mating components to seal using the virtual gasket software capability developed by Dr. Malburg on a Coherix ShaPix 1500 system measuring flatness on parts down to plus or minus 1 micron....

2014-06-24 23:13:15

With the release of Coherix ShaPix Analyzer version 9.2.0 precision manufacturers can now view full surface relationships of several different planes on a prismatic part to the upper and lower tolerances with respect to a true datum. This capability is only available using Coherix technology. Ann Arbor, MI (PRWEB) June 24, 2014 With the latest release of ShaPix software precision manufacturers are now able to view the profile of a surface in 3D eliminating measurement method, processing...

2014-06-24 20:22:07

MAPLE GROVE, Minn., June 24, 2014 /PRNewswire/ -- ZEISS Industrial Metrology today announced the new family of LineScan laser line sensors that improve inspection productivity and enable reverse engineering of complex products on popular CONTURA, ACCURA II and PRISMO CMMs. The new LineScan sensors easily extend the functionality of your ZEISS CMM and are available with stripe widths of 25 mm, 50 mm and 100 mm. http://photos.prnewswire.com/prnvar/20140624/121214 Inspection...

2014-06-23 12:25:53

LONDON, June 23, 2014 /PRNewswire/ -- Reportbuyer.com has added a new market research report: Global Thin Film Metrology Systems Market 2014-2018http://www.reportbuyer.com/industry_manufacturing/machinery/global_thin_film_metrology_systems_market_2014_2018.html TechNavio's analysts forecast the Global Thin Film Metrology Systems market to grow at a CAGR of 5.02 percent over the period 2013-2018. One of the key factors contributing to this market growth is the high demand for thin...


Word of the Day
omphalos
  • The navel or umbilicus.
  • In Greek archaeology: A central boss, as on a shield, a bowl, etc.
  • A sacred stone in the temple of Apollo at Delphi, believed by the Greeks to mark the 'navel' or exact center-point of the earth.
'Omphalos' comes from the ancient Greek.
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