Latest Nanosensors Stories

2014-06-23 23:12:26

NANOSENSORS publishes an English and a Chinese screencast on its new uniqprobes for atomic force microscopy (AFM) and scanning probe microscopy (SPM), which explains the advantages of the main characteristics of uniform quality AFM probes for biology and life science applications. Neuchâtel, Switzerland (PRWEB) June 23, 2014 NANOSENSORS™ announced that a screencast explaining the properties of a completely new SPM (Scanning Probe Microscopy) probe series dedicated for use in...

2013-06-04 23:18:52

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano metrology tools for research labs and industry has recently announced a 90 percent market share in the disc storage market for AFM. Park AFM offers superior technology and performance unmatched by the competition, specifically the highest accuracy in nanoscale due to the independent XY stage and Z scanner architecture, and flexure based design, the low operating cost by its unique True Non-Contact AFM, and...

2013-05-10 23:24:40

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review. Park NX20 is designed to guarantee reliable, reproducible results for better output in failure analysis (FA) and quality assurance (QA) laboratories. Santa Clara, CA (PRWEB) May 10, 2013 Park Systems, world leader in atomic...

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