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Last updated on April 16, 2014 at 11:16 EDT

Latest NanoWorld Stories

2014-02-19 23:23:15

NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). Nechatel, Switzerland (PRWEB) February 19, 2014 NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe...

2013-12-18 23:02:50

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSampleTM scan. This newly developed large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples. Santa Clara, CA (PRWEB) December 18, 2013 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the...

2013-09-25 23:01:08

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolutionfor failure analysis (FA) in the semiconductor industry. Santa Clara, CA (PRWEB) September 25, 2013 Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale...

2013-08-31 23:02:13

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, is exhibiting at the 246th Fall ACS National Meeting and Exposition Sept 8-12, 2013 in Indianapolis, IN. Showcased at the Park Systems booth will be Park NX10, the industry’s most accurate AFM, and the two new AFM advanced features: Step and Scan Automation, a feature that makes Park AFM very easy to use, and Approach Retract Scanning, a conductive AFM mode that greatly increases the resolution and bandwidth for...

2013-06-04 23:18:52

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems and nano metrology tools for research labs and industry has recently announced a 90 percent market share in the disc storage market for AFM. Park AFM offers superior technology and performance unmatched by the competition, specifically the highest accuracy in nanoscale due to the independent XY stage and Z scanner architecture, and flexure based design, the low operating cost by its unique True Non-Contact AFM, and...

2013-05-10 23:24:40

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets, introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review. Park NX20 is designed to guarantee reliable, reproducible results for better output in failure analysis (FA) and quality assurance (QA) laboratories. Santa Clara, CA (PRWEB) May 10, 2013 Park Systems, world leader in atomic...