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Last updated on April 18, 2014 at 0:14 EDT
Researchers Develop Short Flexible Reusable AFM Probe

Researchers Develop Short, Flexible, Reusable AFM Probe

NIST JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer and more agile than standard...

Latest Scanning probe microscopy Stories

2014-04-04 23:36:45

RHK Technology, Inc. announced shipment of its 100th R9 Control System for Scanning Probe Microscopes. Troy, MI (PRWEB) April 03, 2014 RHK Technology, Inc. announced shipment of its 100th R9 Control System for Scanning Probe Microscopes. The latest in RHK’s long history of advances, R9 breaks new ground with its revolutionary design: a totally integrated AFM/STM single-box solution. R9 combines all-digital, ultra-fast, ultra-low-noise electronics with an interface tailored especially...

2014-04-01 23:24:39

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers. Santa Clara, CA (PRWEB) April 01, 2014 Park Systems, a leading manufacturer of...

2014-03-04 23:27:21

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry. The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM thereby providing the most optimum solution to the FA engineers’ needs available in the nanotechnology industry today. Santa...

2014-02-19 23:23:15

NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). Nechatel, Switzerland (PRWEB) February 19, 2014 NanoWorld AG today announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM). High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe...

2014-02-19 08:33:01

LONDON, Feb. 19, 2014 /PRNewswire/ -- Reportbuyer.com just published a new market research report: Microscopy Markets Microscopy is a complex, high-technology market focused on producing enlarged images of very small objects. There is a perception that traditional light and electron microscopy will gradually be replaced by the newly emerging Atomic Force Microscopy (AFM) and Raman confocal systems, but traditional techniques will in reality continue to thrive as they contribute to a...

2014-02-14 08:28:28

DUBLIN, Feb. 14, 2014 /PRNewswire/ -- Research and Markets ( http://www.researchandmarkets.com/research/wphflk/microscopy_markets ) has announced the addition of the "Concise Analysis of the International Microscopy Markets" report to their offering. (Logo: http://photos.prnewswire.com/prnh/20130307/600769) Microscopy is a complex, high-technology market focused on producing enlarged images of very small objects. There is a perception that traditional light and electron microscopy will...

2014-02-13 12:25:30

DUBLIN, February 13, 2014 /PRNewswire/ -- Research and Markets (http://www.researchandmarkets.com/research/xbp8ns/advanced) has announced the addition of the "Advanced Microscopes: The Global Market to 2018" [http://www.researchandmarkets.com/research/xbp8ns/advanced ] report to their offering. (Logo: http://photos.prnewswire.com/prnh/20130307/600769 ) Presented in a graphical format, this fully updated report provides in-depth analysis of their impact in...

2014-02-13 08:35:53

DUBLIN, Feb. 13, 2014 /PRNewswire/ -- Research and Markets ( http://www.researchandmarkets.com/research/6hxmn2/scanning_probe ) has announced the addition of the "Scanning Probe Microscopes: The Global Market to 2020" report to their offering. (Logo: http://photos.prnewswire.com/prnh/20130307/600769) The Scanning Probe Microscope (SPM) market in 2013 generated approximately $440 million in revenues (conservative estimate). Atomic Force Microscopes (AFM) accounted for the majority of this...

2014-02-04 16:23:15

DUBLIN, February 4, 2014 /PRNewswire/ -- Research and Markets (http://www.researchandmarkets.com/research/9d73sc/advanced) has announced the addition of the "Concise Analysis of the Advanced Functional Material Market For Low Carbon Applications - Forecasts to 2018" [http://www.researchandmarkets.com/research/9d73sc/advanced ] report to their offering. (Logo: http://photos.prnewswire.com/prnh/20130307/600769 ) AFM (Advanced Functional Material) for low carbon...

2014-02-01 23:01:40

MarketReportsOnline.com adds “Scanning Probe Microscopes: The Global Market” report to its research library. It includes market revenues, current and forecasted to 2020. Dallas, Texas (PRWEB) February 01, 2014 The Scanning Probe Microscope (SPM) market in 2013 generated approximately $440 million in revenues (conservative estimate). Atomic Force Microscopes (AFM) accounted for the majority of this market with Scanning tunneling microscope (STM) and NSOM making up less than 10%. The...