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Latest Surface metrology Stories

2013-07-10 14:27:15

A BRIGHT future beckons for a University of Huddersfield metrology instrumentation designer who has recently completed his doctorate, won a national award and will now embark on a project to bring a patented product to the market.

2011-06-30 00:00:27

A new multi-technique microscope integrates atomic force microscopy and advanced optical profilometry.

2010-10-18 13:22:00

BERGISCH GLADBACH, Germany, October 18, 2010 /PRNewswire/ -- - CEA-LETI in Grenoble is Purchasing a Unique Wafer Metrology Solution An internationally leading research institution in the microelectronics, information and health technology industries is relying on surface metrology from Germany.

2009-10-05 04:46:00

BERGISCH GLADBACH, Germany, October 5 /PRNewswire/ -- At this year's Semicon Europa 2009, FRT again presents innovative wafer metrology solutions for R&D and process control tasks in MEMS, semiconductor, and photovoltaic production.

2005-07-14 16:55:00

For makers of computers, disk drives and other sophisticated technologies, a guiding principle is the smoother the surfaces of chips and other components, the better these devices and the products, themselves, will function.


Word of the Day
plim
  • To swell, as grain or wood with water.
The word 'plim' is probably a variant of the word 'plum'.
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