Latest Surface metrology Stories
A BRIGHT future beckons for a University of Huddersfield metrology instrumentation designer who has recently completed his doctorate, won a national award and will now embark on a project to bring a patented product to the market.
A new multi-technique microscope integrates atomic force microscopy and advanced optical profilometry.
BERGISCH GLADBACH, Germany, October 18, 2010 /PRNewswire/ -- - CEA-LETI in Grenoble is Purchasing a Unique Wafer Metrology Solution An internationally leading research institution in the microelectronics, information and health technology industries is relying on surface metrology from Germany.
BERGISCH GLADBACH, Germany, October 5 /PRNewswire/ -- At this year's Semicon Europa 2009, FRT again presents innovative wafer metrology solutions for R&D and process control tasks in MEMS, semiconductor, and photovoltaic production.
For makers of computers, disk drives and other sophisticated technologies, a guiding principle is the smoother the surfaces of chips and other components, the better these devices and the products, themselves, will function.
- To swell, as grain or wood with water.