Latest Surface metrology Stories

2013-07-10 14:27:15

A BRIGHT future beckons for a University of Huddersfield metrology instrumentation designer who has recently completed his doctorate, won a national award and will now embark on a project to bring a patented product to the market. The University has earned a reputation as one of the foremost centers for surface metrology research in Europe through the work of scientists and engineers in the EPSRC Centre for Innovative Manufacturing in Advanced Metrology, though it was an MSc in Control...

2011-06-30 00:00:27

A new multi-technique microscope integrates atomic force microscopy and advanced optical profilometry. The unique system combination provides an extremely wide range of metrology capabilities, unmatched by any other instrument. Phoenix, AZ (PRWEB) June 29, 2011 Nanoscience Instruments announces an integrated 3D optical microscope and atomic force microscope (AFM) system. The new system combines a compact Nanosurf LensAFM with an advanced Zeta Instruments optical profiler. This unique...

2010-10-18 13:22:00

BERGISCH GLADBACH, Germany, October 18, 2010 /PRNewswire/ -- - CEA-LETI in Grenoble is Purchasing a Unique Wafer Metrology Solution An internationally leading research institution in the microelectronics, information and health technology industries is relying on surface metrology from Germany. CEA-LETI will be working with a fully automatic wafer inspection system, the FRT MFE (Metrology For Frontend). With this tool, FRT has developed a universal solution for the most diverse...

2009-10-05 04:46:00

BERGISCH GLADBACH, Germany, October 5 /PRNewswire/ -- At this year's Semicon Europa 2009, FRT again presents innovative wafer metrology solutions for R&D and process control tasks in MEMS, semiconductor, and photovoltaic production. A selection of FRT's products can be viewed and tried for test measurements in hall 3, booth 101 at Semicon Europa in Dresden from October 6th to 8th 2009. One of these year's highlights is the multisensor metrology tool MicroProf TTV that precisely...

2005-07-14 16:55:00

For makers of computers, disk drives and other sophisticated technologies, a guiding principle is the smoother the surfaces of chips and other components, the better these devices and the products, themselves, will function. So, some manufacturers might be surprised to learn that a fast and increasingly popular method for measuring surface texture can yield misleading results. As reported at recent conferences and in an upcoming issue of Applied Optics,* a team of National Institute of...

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