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Latest Transmission electron microscopy Stories

2011-07-11 06:01:00

MIGDAL HAEMEK, Israel, July 11, 2011 /PRNewswire/ -- Camtek Ltd. (NASDAQ and TASE: CAMT) ("Camtek" or the "Company"), announced today that a leading Semiconductor Manufacturer has selected Xact, Camtek's Advanced Transmission Electron Microscope (TEM) sample preparation solution, enabling material analysis and verification. The system was installed during the second quarter of 2011. Shrinking feature dimensions and advances in material complexity require a scale of...

2011-07-05 23:07:59

Graphene, discovered in 2004 at The University of Manchester by Professor Andre Geim and Professor Kostya Novoselov, is one of the world's most versatile materials, and is already being used in such varied applications as touch screens, transistors and aircraft wings. Researchers from the University are presenting the vast potential of the wonder material at the Royal Society's annual Summer Science Exhibition which opens today (5 July 2010). The display aims to tell the remarkable story of...

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2011-06-24 08:43:43

When semiconductor nanorods are exposed to light, they blink in a seemingly random pattern. By clustering nanorods together, physicists at the University of Pennsylvania have shown that their combined "on" time is increased dramatically providing new insight into this mysterious blinking behavior. The research was conducted by associate professor Marija Drndic's group, including graduate student Siying Wang and postdoctorial fellows Claudia Querner and Tali Dadosh, all of the Department of...

2011-06-10 05:30:00

DALLAS, Texas, June 10, 2011 /PRNewswire/ -- The 'World Microscopy Market: Products, Applications and Forecasts (2010 -2015)' analyzes and studies the major market drivers, restraints, and opportunities in regions such as North America, Europe, Asia, & Rest of the world. Browse market data tables and in-depth TOC on World Microscopy Market: Products, Applications and Forecasts (2010 -2015) http://www.marketsandmarkets.com/Market-Reports/world-microscopy-399.html Early buyers will...

2011-05-11 19:36:47

The software enables electron microscopes to extract more information about the composition of crystals A new software called QED (Quantitative Electron Diffraction), which has been licensed by Max Planck Innovation, has now been released by HREM Research Inc., a Japan based company, which is developing products and services in the field of High-Resolution Electron Microscopy. QED allows transmission electron microscopes to acquire novel kinds of data, opening up new possibilities in electron...

2010-06-21 07:28:00

DALLAS, June 21, 2010 /PRNewswire/ -- The Medical Device practice at MarketsandMarkets is pleased to announce a new report titled Microscopy - Advanced Technologies in Latin America (2010 - 2015). Browse in-depth TOC on Microscopy - Advanced Technologies in Latin America (2010 - 2015) Market Report. Early buyers will receive 10% customization of reports http://www.marketsandmarkets.com/Market-Reports/Microscopy-America-238.html The development of confocal microscopes and new...

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2010-06-17 07:26:49

Scientists can now peer into the inner workings of catalyst nanoparticles 3,000 times smaller than a human hair within nanoseconds. The findings point the way toward future work that could greatly improve catalyst efficiency in a variety of processes that are crucial to the world's energy security, such as petroleum catalysis and catalyst-based nanomaterial growth for next-generation rechargeable batteries. The work was performed in a collaborative effort by Lawrence Livermore National...

2010-04-15 05:43:00

MIGDAL HAEMEK, Israel, April 15, 2010 /PRNewswire-FirstCall/ -- Camtek Ltd. (NASDAQ and TASE: CAMT) ("Camtek" or the "Company"), announced today that a leading Semiconductor Equipment Supplier has selected the Xact, Camtek's Advanced STEM/TEM (Scanning Transmission Electron Microscope) sample preparation solution, enabling material analysis and verification. The Xact system will be installed in the second quarter of 2010. Shrinking feature dimensions and advances in material...

2010-03-25 09:54:25

ORNL Z-contrast microscope first to resolve, identify individual light atoms OAK RIDGE, Tenn. -- Using the latest in aberration-corrected electron microscopy, researchers at the Department of Energy's Oak Ridge National Laboratory and their colleagues have obtained the first images that distinguish individual light atoms such as boron, carbon, nitrogen and oxygen. The ORNL images were obtained with a Z-contrast scanning transmission electron microscope (STEM). Individual atoms of carbon,...

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2010-03-25 06:40:00

Material scientists have high hopes that one day they will be able place a sample of unknown substance under a microscope and be able to name individual atoms and what structure they form, reports the AFP news agency. Thanks to a feat by US scientists, they are one step closer to that goal. Scientists used a transmission electron microscope to analyze a single layer of film made up of boron nitride. They were able to distinguish boron atoms from nitrogen atoms, as well as oxygen and carbon...