Latest X-ray fluorescence Stories
MIGDAL HA'EMEK, Israel, June 16, 2011 /PRNewswire/ -- Jordan Valley Semiconductors Ltd., a leading provider of X-ray metrology solutions for advanced semiconductor fabs, announced today the delivery of a follow-on order of its JVX7200 and JVX6200 thin-film metrology systems for a major foundry in the Far East. "This repeat order clearly shows the customer's confidence in our system's enabling capabilities and production worthiness," said Mr.
MOUNTAIN VIEW, Calif., Oct. 12 /PRNewswire/ -- Based on its recent research on the EDXRF Analyzers market, Frost & Sullivan presents Xenemetrix, Inc. with the 2010 Global Product Line Strategy of the Year Award.
TAU develops tool for non-destructive x-ray scanning of archaeological finds
- A transitional zone between two communities containing the characteristic species of each.