Latest X-ray fluorescence Stories
MOUNTAIN VIEW, Calif., Oct. 12 /PRNewswire/ -- Based on its recent research on the EDXRF Analyzers market, Frost & Sullivan presents Xenemetrix, Inc. with the 2010 Global Product Line Strategy of the Year Award.
TAU develops tool for non-destructive x-ray scanning of archaeological finds
HOLBROOK, N.Y., July 12 /PRNewswire/ -- Solar Metrology, a global provider of X-Fay Fluorescence (XRF) analysis tools, expands its portfolio of System SMX thin film composition and thickness measurement tools with the introduction of model SMX-ILH. The SMX-ILH (In-Line X-ray Head) tool is designed for in-line composition and thickness control of CIGS and CdTe photovoltaic thin film depositions.
SAN FRANCISCO, July 7 /PRNewswire/ -- World leading X-ray analytical instrument manufacturer, PANalytical (Almelo, The Netherlands) has changed the game in multi-purpose X-ray diffraction (XRD) with the launch of its Empyrean high-performance diffractometer this year.
NASA's Curiosity rover, coming together for a late 2011 launch to Mars, has a newly installed component: a key onboard X-ray instrument for helping the mission achieve its goals.
MIGDAL HAEMEK, Israel, June 24, 2010 /PRNewswire/ -- Sales momentum continues as Jordan Valley Semiconductors Ltd.
MOUNTAIN VIEW, Calif., Feb. 3 /PRNewswire/ -- Burgeoning demand from applications such as forensics, environmental protection, pollution, recycling, and research is expected to provide support for the world X-ray instrumentation markets.
DURHAM, England and MIGDAL HAEMEK, Israel, February 1 /PRNewswire/ -- Jordan Valley Semiconductors Ltd.
MIGDAL HA'EMEK, Israel, Sept.
MIGDAL HA'EMEK, Israel, May 11 /PRNewswire/ -- Jordan Valley Semiconductors Ltd. announced that Korea-based Samsung Electronics Co. Ltd, has selected the JVX6200 advanced thin films, in-line metrology system for their next generation applications in the FEOL and BEOL areas.
- The abrogation of a law by a higher authority; annulment.