Latest X-ray fluorescence Stories

2010-07-12 07:00:00

HOLBROOK, N.Y., July 12 /PRNewswire/ -- Solar Metrology, a global provider of X-Fay Fluorescence (XRF) analysis tools, expands its portfolio of System SMX thin film composition and thickness measurement tools with the introduction of model SMX-ILH. The SMX-ILH (In-Line X-ray Head) tool is designed for in-line composition and thickness control of CIGS and CdTe photovoltaic thin film depositions.

2010-07-07 07:30:00

SAN FRANCISCO, July 7 /PRNewswire/ -- World leading X-ray analytical instrument manufacturer, PANalytical (Almelo, The Netherlands) has changed the game in multi-purpose X-ray diffraction (XRD) with the launch of its Empyrean high-performance diffractometer this year.

2010-06-29 07:02:33

NASA's Curiosity rover, coming together for a late 2011 launch to Mars, has a newly installed component: a key onboard X-ray instrument for helping the mission achieve its goals.

2010-06-24 07:58:00

MIGDAL HAEMEK, Israel, June 24, 2010 /PRNewswire/ -- Sales momentum continues as Jordan Valley Semiconductors Ltd.

2010-02-03 07:30:00

MOUNTAIN VIEW, Calif., Feb. 3 /PRNewswire/ -- Burgeoning demand from applications such as forensics, environmental protection, pollution, recycling, and research is expected to provide support for the world X-ray instrumentation markets.

2010-02-01 12:07:00

DURHAM, England and MIGDAL HAEMEK, Israel, February 1 /PRNewswire/ -- Jordan Valley Semiconductors Ltd.

2009-05-11 11:53:00

MIGDAL HA'EMEK, Israel, May 11 /PRNewswire/ -- Jordan Valley Semiconductors Ltd. announced that Korea-based Samsung Electronics Co. Ltd, has selected the JVX6200 advanced thin films, in-line metrology system for their next generation applications in the FEOL and BEOL areas.

2009-04-14 23:01:00

MIGDAL HA'EMEK, ISRAEL, April 15 /PRNewswire/ -- Jordan Valley Semiconductors LTD, a provider of semiconductor metrology solutions, announced today that TSMC (TAIEX: 2330, NYSE: TSM), the world's largest dedicated semiconductor foundry, has selected JVX 6200 X-ray metrology tool for measuring the thickness of thin film copper layers in TSMC.

2008-08-05 09:01:02

El Capitan Precious Metals, Inc. (OTCBB:ECPN) reports that the Company's metallurgical R&D initiative involving several large composites drill hole samples of the El Capitan deposit have completed key project milestones.

Word of the Day
  • A ceramic container used inside a fuel-fired kiln to protect pots from the flame.
The word 'saggar' may come from 'safeguard'.